Advances in optical and electron microscopy - download pdf or read online

By Tom Mulvey, Charles J.R. Sheppard

ISBN-10: 0120299127

ISBN-13: 9780120299126

The volumes during this sequence hide the development and innovation in optical and electron microscopy at a primary point. it truly is aimed toward microscopists and researchers not just attracted to microscope instrumentation but additionally in functions starting from organic recommendations to fabrics learn and business inspection

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Unfortunately, in practice, the object and image amplitudes a(r), A(v) and the phases 0(r), Φ(Γ) do not usually agree. If, however, the image wave is precisely known in its amplitude ^4(r) and its phase O(r), the object wave can be determined uniquely by deconvolution from the "point spread function" FT{ T(R)). The microscopist has then got all the information about the object structure that is available from the elastically scattered electrons; it only remains to determine the underlying object structure, for example, by simulation methods.

H. LICHTE 34 A. Taking the electron hologram Image plane off-axis electron holograms are recorded in an electron microscope equipped with a Möllenstedt-type electron biprism (Möllenstedt and Düker, 1956) inserted between the back focal plane and the intermediate image plane of the objective lens, as shown in Fig. 5. The object under investigation is so positioned that it covers only one half of the object plane while the remainder allows free passage for the reference wave. Thus in the image plane, on one side of the shadow of the biprism filament one finds the image wave b{r) and on the other side the plane reference wave p(r).

38 H. LICHTE amplitude is proportional to the electron intensity it was exposed to, the reconstruction of the image wave can be performed by means of the optical setup shown schematically in Fig. 7. The electron hologram is illuminated with a laser light wave and imaged by means of the reconstruction lens; in the back focal plane the Fourier transform of the hologram can be found. Figure 8 shows the zero beam surrounded by the autocorrelation and, on either side, the two sidebands representing the Fourier spectrum of the reconstructed image wave.

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Advances in optical and electron microscopy by Tom Mulvey, Charles J.R. Sheppard


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